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Journal
Quantum Information Processing
Year of Publication
2011
Status
Published
ISSN Number
1570-0755
Number of Pages
1–12
Volume
10
Abstract

We present two measures of distance between quantum processes which can be measured directly in laboratory without resorting to process tomography. The measures are based on the superfidelity, introduced recently to provide an upper bound for quantum fidelity. We show that the introduced measures partially fulfill the requirements for distance measure between quantum processes. We also argue that they can be especially useful as diagnostic measures to get preliminary knowledge about imperfections in an experimental setup. In particular we provide quantum circuit which can be used to measure the superfidelity between quantum processes. We also provide a physical interpretation of the introduced metrics based on the continuity of channel capacity.

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